|THPAL142||Surface Characterization of NbTiN Films for Accelerator Applications||3975|
|SUSPL069||use link to see paper's listing under its alternate paper code|
Funding: Work supported by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
The development of next-generation SRF cavities requires the deployment of innovative material solutions with RF performance beyond bulk Nb. Theoretical interest has stimulated efforts to grow and characterize thin multi-layer superconductor/insulator/superconductor (SIS) structures for their potential capability of supporting otherwise inaccessible surface magnetic fields in SRF cavities *. The ternary B1-compound NbTiN is among the candidate superconducting materials for SIS structures. Single crystal NbTiN films with thicknesses below 15 nm are also of interest for the development of high resolution, high sensitivity (SNSPD) detectors for particle physics application. Using DC reactive magnetron sputtering, NbTiN can be deposited with nominal superconducting parameters. This contribution presents the on-going material surface and superconducting properties characterization in order to optimize the NbTiN films for each application.
* A Gurevich, "Maximum screening fields of superconducting multilayer structures", AIP ADVANCES 5, 017112 (2015)
|DOI •||reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-THPAL142|
|Export •||reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)|