|THPML106||Electron Microscopy Inspired Setup for Single-Shot 4-D Trace Space Reconstruction of Bright Electron Beams||4909|
Funding: This work has been partially supported by the National Science Foundation under Grant No. 1549132 and Department of Energy under award No. DE-SC0009914.
In the development of low charge, single-shot diagnostics for high brightness electron beams, Transmission Electron Microscopy (TEM) grids present certain advantages compared to pepper pot masks due to higher beam transmission. In this paper, we developed a set of criteria to optimize the resolution of a point projection image. However, this configuration of the beam with respect to the grid and detector positions implies the measurement of a strongly correlated phase space which entails a large sensitivity to small measurement errors in retrieving the projected emittance. We discuss the possibility of an alternative scheme by inserting a magnetic focusing system in between the grid and the detector, similar to an electron microscope design, to reconstruct the phase space when the beam is focused on the grid.
|DOI •||reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-THPML106|
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