Author: D'Angelo, G.
Paper Title Page
WEPMG006 Experimental Setup to Characterize the Radiation Hardness of Cryogenic Bypass Diodes for the HL-LHC Inner Triplet Circuits 2620
  • A. Will, G. D'Angelo, R. Denz, M.F. Favre, D. Hagedorn, G. Kirby, T. Koettig, A. Monteuuis, F. Rodriguez-Mateos, A.P. Siemko, K. Stachon, M. Valette, A.P. Verweij, D. Wollmann
    CERN, Geneva, Switzerland
  • A. Bernhard, A.-S. Müller
    KIT, Karlsruhe, Germany
  • L. Kistrup
    KEA, Copenhagen, Denmark
  Funding: Work supported by the Wolfgang Gentner Programme of the German Federal Ministry of Education and Research
For the high luminosity upgrade of the Large Hadron Collider (LHC), it is planned to replace the existing triplet quadrupole magnets with Nb3Sn quadrupole magnets, which provide a comparable integrated field gradient with a significantly increased aperture. These magnets will be powered through a novel superconducting link based on MgB2 cables. One option for the powering layout of this triplet circuit is the use of cryogenic bypass diodes, where the diodes are located inside an extension to the magnet cryostat and operated in superfluid helium. Hence, they are exposed to radiation. For this reason the radiation hardness of existing LHC type bypass diodes and more radiation tolerant prototype diodes needs to be tested up to the radiation doses expected at their planned position during their lifetime. A first irradiation test is planned in CERN's CHARM facility starting in spring 2018. Therefore, a cryo-cooler based cryostat to irradiate and test LHC type diodes in-situ has been designed and constructed. This paper will describe the properties of the sample diodes, the experimental roadmap and the setup installed in CHARM. Finally, the first measurement results will be discussed.
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