Author: Dai, J.P.
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MOPMK017 Transient Beam Loading Due to the Bunch Train Gap and Its Compensation Experiments at BEPC-II and ALS 390
  • H. Wang, R.A. Rimmer, S. Wang
    JLab, Newport News, Virginia, USA
  • J.P. Dai, Q. Qin, J. Xing, J.H. Yue, Y. Zhang
    IHEP, Beijing, People's Republic of China
  • D. Teytelman
    Dimtel, San Jose, USA
  Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
Non-uniform bunch fill patterns in storage rings, driven by the need to provide gaps for beam aborting and ion clearing cause a large beam loading change in the RF cavities. The induced turn-periodic transient in the cavity voltage modulates longitudinal beam properties along the train, such as synchronous position and bunch length. In the EIC design, due to the asymmetric bunch train structure between the electron and the ion beam, such modulation results in shifting collision point and leads to reduced luminosity. We have carried out the beam based experiments at BEPC-II and ALS using bunch-by-bunch diagnostic capabilities of the coupled-bunch feedback systems to study this transient effect. A modulated bunch filling pattern with higher charge density around the gap has been demonstrated to be effective in partially compensating this transient modulation. Details of the experimental setups and the data analysis will be presented to this conference.
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