Author: Gohil, C.G.
Paper Title Page
THPAF047 Measurements and Impact of Stray Fields on the 380 GeV Design of CLIC 3072
  • C.G. Gohil, M.C.L. Buzio, E. Marín, D. Schulte
    CERN, Geneva, Switzerland
  • P. Burrows
    JAI, Oxford, United Kingdom
  Previous studies of the 3 TeV Compact Linear Collider (CLIC) design have shown a sensitivity to external dynamic magnetic fields (stray fields) on the nanoTesla level. In this paper the obtained tolerances for stray fields in the 380 GeV CLIC design are presented. In order to determine potential stray field sources, a measurement sensor has been acquired and used to investigate the magnetic contamination from technical equipment. The collected measurements, as well as details of the sensor, are discussed.  
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