Author: Gordon, M.A.
Paper Title Page
THPAF024 Understanding and Compensating Emittance Diluting Effects in Highly Optimized Ultrafast Electron Diffraction Beamlines 3004
  • C. M. Pierce, I.V. Bazarov, C.M. Gulliford, J.M. Maxson
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  • S. Baturin
    Enrico Fermi Institute, University of Chicago, Chicago, Illinois, USA
  • M.A. Gordon, Y.K. Kim
    University of Chicago, Chicago, Illinois, USA
  Funding: This work was supported by the Center for Bright Beams, NSF PHY-1549132 and Department of Energy grant DE-SC0014338.
The application of Multiobjective Genetic Algorithm optimization (MOGA) to photoemission based ultrafast electron diffraction (UED) beamlines featuring extremely low cathode mean transverse energies has lead to designs with emittances as low as 1 nm for sub-picosecond bunches with 105 electrons*. Analysis of these results shows significant emittance growth during transport: with emittance dilution as high as a factor of 200-4000% for various designs and optics settings. In this study we quantify and model the individual sources of emittance growth (slice mismatches and space charge), and explore the use of the core emittance as a strong invariant.
C. Gulliford, A. Bartnik, and I. Bazarov. Multi-
objective optimizations of a novel cryocooled dc gun based
UED beam line. Phys. Rev. Ac-
celerators and Beams, 19(9):093402, 2016.
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