06 Beam Instrumentation, Controls, Feedback, and Operational Aspects
T26 Photon Beam Lines and Components
Paper Title Page
WEPAF058 Detection of X-Rays and Charged Particles via Detuning of the Microwave Resonator 1958
 
  • S.P. Antipov
    Euclid TechLabs, LLC, Solon, Ohio, USA
  • S.V. Kuzikov
    Euclid Beamlabs LLC, Bolingbrook, USA
  • S. Stoupin
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  • A.A. Vikharev
    IAP/RAS, Nizhny Novgorod, Russia
 
  Funding: DOE SBIR
Critically coupled microwave resonator is a finely balanced system, reflection at the resonance is virtually zero. Small changes in dielectric properties of resonator parts destroy this balance, small reflection can be detected from the resonator. This measurement is used in electron paramagnetic resonance studies. In this paper we discuss two accelerator - related applications of this technology. First is related to beam halo measurement taking advantage of high sensitivity of the microwave measurement. High energy particles crossing the diamond inside of a tuned resonator induce a weak conductivity in the sensing material. This small change results in resonator decoupling providing a signal proportional to a number of particles crossing the diamond plate. Second application considered is the x-ray flux monitoring. In this case it is x-ray induced photoconductivity which alters resonator coupling and produces a signal. Interestingly, sensing dielectric material embedded in a resonator can be a diamond or kapton window, refractive lens or part of a silicon monochromator. Thus an inevitable x-ray absorption on optical elements of the beamline is used to monitor x-ray flux online.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-WEPAF058  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)